Practical Applications of Broad Ion Beam Milling | Learn ...
Sep 14, 2017· Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing crosssectioned samples for electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM) or light microscope investigation. In contrast, ion beam milling can eliminate undesirable artifacts that will hamper your analysis and interpretation.